Title: Atomic Force Microscopy Beyond Imaging: Characterizing, Mapping, and Engineering the Nanoscale
Atomic Force Microscopy (AFM) is far more than an imaging tool. It can map a wide range of physical, chemical, and functional properties at the nanoscale. This lecture introduces the diverse modes of AFM, including topography, mechanical, piezoelectric, electrical, magnetic, and friction measurements, highlighting how a single instrument can provide multidimensional insights into materials and biological systems. Through illustrative examples, participants will discover how AFM serves as a versatile platform for researchers across physics, chemistry, biology, and materials science.